Electronics Engineering

Determination of Diode Characteristics

Determination of Diode Characteristics: Determination of Diode Characteristics – The forward characteristics of a diode can be obtained by use of the circuit depicted in Fig. 7.16 (a). The diode voltage is set at a series of convenient levels, and the corresponding current levels are measured and recorded. The characteristics are then plotted from the […]

Determination of Diode Characteristics Read More »

Diode Failure Modes and Causes

Diode Failure Modes and Causes: We would certainly like for solid-state components to be 100% reliable but this is unfortunately not true. All solid-state devices have a certain probability of failure. To be good circuit designers and/or good circuit troubleshooters, we should have some idea of the most likely failure modes for solid-state devices. This

Diode Failure Modes and Causes Read More »

Metal Semiconductor Junctions

Metal Semiconductor Junctions: Metal semiconductor junctions are very common in all semiconductor devices and are very important. Depending upon the doping concentration, materials, and the characteristics of the interface, the metal semiconductor junctions can act as either an ohmic contact or as a Schottky barrier. Structure of Metal Semiconductor Junctions: A metal-semiconductor junction, as its

Metal Semiconductor Junctions Read More »

Zero bias PN junction

Zero bias PN junction: Zero bias PN junction – Here we will examine the properties of the step junction in thermal equilibrium, where no currents exist and no external excitation is applied. We will determine built-in potential barrier through the depletion or space-charge region, electric field and width of the space-charge region. Built-in Potential Barrier:

Zero bias PN junction Read More »

Scroll to Top